Available Technology
High-yield fabrication of single-walled carbon nanotube probe tips for atomic force microscopy
Technology:
Short nanotube tips for high-resolution imaging
Markets Addressed
Nanotube tip optimization techniques allow the fabrication of short nanotube tips for high-resolution imaging. The nanotube tips may be functionalized for chemically and/or biologically sensitive imaging. The invention may represent a commercially viable way to produce AFM probes tipped with single-walled carbon nanotubes.
Innovations and Advantages
This invention concerns a novel method of making single-walled carbon nanotubes with small diameters (1 - 5 nm) and placing one on an atomic force microscope's (AFM) probe to make a super-sensitive probe for imaging atomic scale objects. The synthesis method entails the use of chemical vapor deposition (CVD) using nanoparticles of metals, such as iron, to catalyze nanotube growth on the particles. The diameter of the nanoparticle determines the diameter of the nanotube. By utilizing a colloid of iron nanoparticles deposited on a silicon substrate and ethylene gas as the carbon source the inventors have synthesized "lawns" of diameter controlled single-walled carbon nanotubes placed vertically on the substrate. One of these nanotubes is placed on a AFM probe tip by using the AFM probe to image a nanotube and by Van der Waals forces to connect it to the probe.
The method of the invention is superior to previous methods, which involved either a tedious and time consuming micromanipulation to place a nanotube on a probe, or a low yield synthesis of nanotubes on the probe.
Additional Information
Intellectual Property Status: Issued U.S. patent nos.: 6,716,409
See the published PCT patent application, PCT/US01/29202.
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Inventor(s):
Cheung, Chin Li
Hafner, Jason H.
Lieber, Charles M.
Categories:
For further information, please contact:
Mick Sawka, Director of Business Development
(617) 496-3830
Reference Harvard Case #1816